The structure of Si nanocrystals on SiC.

نویسندگان

  • U Kaiser
  • A Chuvilin
  • K Saitoh
  • W Richter
چکیده

Si nanocrystals grown on cubic SiC have been characterized using high-resolution transmission electron microscopy. At lower temperatures nanocrystals grow in two different orientations, whereas at higher temperatures they grow in a single preferred orientation. The nanocrystals are shown to be unstrained; in some cases possibly due to the presence of a thin amorphous wetting layer.

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عنوان ژورنال:
  • Journal of electron microscopy

دوره 50 4  شماره 

صفحات  -

تاریخ انتشار 2001